Depending on the probe, the hand-held device with the clearly arranged display determines the thickness of non-magnetic layers on magnetizable substrates (according to DIN EN ISO 2178) and the thickness of non-conductive layers on non-magnetic, conductive base material using the eddy current principle (according to DIN EN ISO 2360).
External probes are available from a large variety of models, so the most diverse testing problems can be solved.
Office address
21st. Atir-Yeda St
Kfar-Saba, 4464316, Israel
עתיר-ידע 21 כפר-סבא 4464316
Mailing address
P.O.B. 3008, Hod-Hasharon
4513001, Israel
ת.ד. 3008 הוד-השרון 4513001
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